Structural Characterization Services

Structural Characterization Services

Because of their crystal structure, phase, and internal stress, two samples of the same material can behave differently. Structural characterization measures what elemental analysis cannot: the crystalline phases present, how grains are oriented, and the residual stress locked into a part. MatX Lab uses diffraction methods to identify phase, map texture and orientation, quantify phase fractions, and measure residual stress. The work reads the crystallographic structure that governs strength, cracking, and performance.

What Is Structural Characterization?

For a clear understanding, structural characterization provides information regarding the crystallography of the material, that is, what phases exist, what the arrangement of the crystal lattice is, grain orientation, and residual stress in the material. For phase identification, X-ray diffraction is the most common technique, which detects the phases through diffraction patterns, while for orientation and texture of the material, electron backscatter diffraction is used under the microscope.

Techniques We Offer

Structural work depends on whether you need phase, orientation, or stress, and we scope the right method. Each technique below links to its own page.

X-ray Diffraction (XRD)

Identifies crystalline phases and structure and measures crystallinity from the diffraction pattern. It is the core method for phase identification and structure.

Electron Backscatter Diffraction (EBSD)

Maps grain orientation, texture, and phase at the microscale in the SEM, giving a direct, quantitative picture of grain structure.

Residual Stress Analysis

Measures the internal stress locked into a part by X-ray diffraction and complementary methods, a common driver of fatigue and stress-corrosion cracking.

Texture and Pole-Figure Analysis

Measures preferred crystallographic orientation that governs anisotropic mechanical and physical properties.

Phase Quantification and Retained Austenite

Quantifies phase fractions by diffraction, including retained austenite in heat-treated steels.

Grazing-Incidence XRD (GIXRD)

Determines the phase and structure of thin films and coatings by keeping the beam near the surface.

Small-Angle X-ray Scattering (SAXS)

Characterizes nanoscale structure, particle size, and ordering in materials and solutions.

When to Use Structural Characterization

Structural characterization is the appropriate method whenever phase, orientation, or internal stress drives behavior.

• Identifying crystalline phases and structure.
• Confirming heat treatment through phase and retained austenite
• Measuring residual stress that drives cracking.
• Mapping grain orientation and texture.
• Characterizing thin-film phase and nanoscale structure.

Materials & Industries We Apply It To

Structural characterization applies wherever crystal structure and stress govern performance.

Materials: Metals & Alloys · Ceramics & Glass · Thin Films & Coatings · Wafers & Die · Nanomaterials · Powders & Bulk Solids

Industries: Aerospace · Automotive · Energy · Semiconductors · Metals & Metalworking · Advanced Materials

Standards & Test Methods

These diffraction and residual-stress testing are governed by ASTM, ISO, and SEMI methods, and your specification may name them. Where an applicable standard exists, testing is aligned to it and cited in your report. We align to the method your specification requires and document it for you.