MatX Lab uses surface-sensitive methods to identify contamination, characterize thin films and their interfaces, measure surface chemistry, and profile composition through a stack.
The surface, usually a few nanometers of a material, decides adhesion, corrosion, wetting, and contamination, and none of it shows in a bulk analysis. It is the reason surface analysis analyzes the chemistry and composition of that surface layer, where coatings bond, films grow, and contaminants hide. MatX Lab uses surface-sensitive methods to identify contamination, characterize thin films and their interfaces, measure surface chemistry, and profile composition through a stack. The work reads the surface that most performance and failure questions come down to.
Theoretically, this surface analysis is the set of techniques that measure the chemical composition and state of the outermost atomic layers of a material. X-ray photoelectron spectroscopy identifies elements and their chemical state in the top few nanometers, Auger spectroscopy adds high spatial resolution, and secondary ion mass spectrometry adds extreme sensitivity for trace and molecular species. Combined with depth profiling and wettability, they characterize surfaces and interfaces that bulk methods cannot see.
Surface work depends on the sensitivity, resolution, and information you need, and we scope the right method. Each technique below links to its own page.
It measures elemental composition and chemical state in the top few nanometers, with depth profiling. It is the standard for surface chemistry, oxidation state, and thin-film contamination.
Provides surface elemental analysis with high spatial resolution, ideal for small features, particles, and thin films at the sub-micron scale.
Delivers extremely sensitive molecular and elemental mapping of the surface, including trace organics and depth profiles that other methods miss.
In this, ion sputtering is combined with surface analysis to measure composition through a coating or film, layer by layer, resolving interfaces in a stack.
Measures wettability and surface free energy, the properties that control adhesion, coating, printing, and cleanliness.
Identifies organic films, residues, and contamination on surfaces by infrared spectroscopy, a fast route to surface contamination identity.
Provides rapid elemental depth profiling of coatings and surfaces, useful for thicker films and quick composition-versus-depth work.
Surface analysis is the right method when the surface, not the bulk, determines performance.
Surface analysis is done wherever coatings, films, and surface chemistry govern behavior.
Materials: Thin Films & Coatings · Wafers & Die · Metals & Alloys · Nanomaterials · Biomaterials · Adhesives & Sealants
Industries: Semiconductors · Electronics · Aerospace · Medical Devices · Automotive · Manufacturing
This Surface analysis is governed by ISO and ASTM methods for calibration, quantification, and depth profiling. Where an applicable standard exists, testing is aligned to it and cited in your report. We align to the method your specification requires and document it.
| Analysis / Standard | What It Covers |
|---|---|
| XPS | X-Ray Photoelectron Spectroscopy |
| ToF-SIMS | Time-Of-Flight Secondary Ion Mass Spectrometry |
| High Res XPS | High-Resolution X-Ray Photoelectron Spectroscopy |
| AES | Auger Electron Spectroscopy |
| SIMS | Secondary Ion Mass Spectrometry |
| Ellipsometry | Surface Roughness & Topography |
| Optical Profilometry | Surface Roughness & Topography |
| ASTM F21 | Hydrophobic Surface Films Test |
| ASTM E996 | XPS & Auger Electron Spectroscopy Data Reporting & Analysis |
| ASTM E995 | Background Subtraction in Auger & XPS Spectra |
| ASTM E984 | Chemical & Matrix Effect Identification in Auger Electron Spectroscopy |
| ASTM D7490 | Contact Angle Measurements |
| ASTM B568 | Coating Thickness Measurement by XRF |
| ASTM D6556 | Total and External Surface Area by Nitrogen Adsorption |
| ASTM D6132 | Dry Film Thickness using an Ultrasonic Gauge |
MatX Lab is associated with a network of accredited partner laboratories, so surface chemistry, depth-profiling, and wettability work run under one program. One contact, one report. Methods are aligned to ASTM, ISO, IEC, UL, and MIL-STD where a published method applies. MatX Lab is an analysis provider, not a standards body, and issues no certifications. NDAs are routine.
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