Analytical Capabilities

Surface Analysis Services

MatX Lab uses surface-sensitive methods to identify contamination, characterize thin films and their interfaces, measure surface chemistry, and profile composition through a stack.

Methods aligned toASTMISOULMIL-STDTesting coordinated through accredited partner laboratories

Surface Analysis

Surface Analysis Services

The surface, usually a few nanometers of a material, decides adhesion, corrosion, wetting, and contamination, and none of it shows in a bulk analysis. It is the reason surface analysis analyzes the chemistry and composition of that surface layer, where coatings bond, films grow, and contaminants hide. MatX Lab uses surface-sensitive methods to identify contamination, characterize thin films and their interfaces, measure surface chemistry, and profile composition through a stack. The work reads the surface that most performance and failure questions come down to.

What Is Surface Analysis?

Theoretically, this surface analysis is the set of techniques that measure the chemical composition and state of the outermost atomic layers of a material. X-ray photoelectron spectroscopy identifies elements and their chemical state in the top few nanometers, Auger spectroscopy adds high spatial resolution, and secondary ion mass spectrometry adds extreme sensitivity for trace and molecular species. Combined with depth profiling and wettability, they characterize surfaces and interfaces that bulk methods cannot see.

Techniques We Offer

Surface work depends on the sensitivity, resolution, and information you need, and we scope the right method. Each technique below links to its own page.

X-ray Photoelectron Spectroscopy (XPS/ESCA)

It measures elemental composition and chemical state in the top few nanometers, with depth profiling. It is the standard for surface chemistry, oxidation state, and thin-film contamination.

Auger Electron Spectroscopy (AES)

Provides surface elemental analysis with high spatial resolution, ideal for small features, particles, and thin films at the sub-micron scale.

Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

Delivers extremely sensitive molecular and elemental mapping of the surface, including trace organics and depth profiles that other methods miss.

Depth Profiling

In this, ion sputtering is combined with surface analysis to measure composition through a coating or film, layer by layer, resolving interfaces in a stack.

Contact Angle and Surface Energy

Measures wettability and surface free energy, the properties that control adhesion, coating, printing, and cleanliness.

ATR-FTIR Surface Analysis

Identifies organic films, residues, and contamination on surfaces by infrared spectroscopy, a fast route to surface contamination identity.

Glow Discharge Optical Emission Spectroscopy (GD-OES)

Provides rapid elemental depth profiling of coatings and surfaces, useful for thicker films and quick composition-versus-depth work.

When to Use Surface Analysis

Surface analysis is the right method when the surface, not the bulk, determines performance.

  • Identifying surface contamination and residues.
  • Characterizing thin-film composition and interfaces.
  • Investigating adhesion and coating failures.
  • Measuring oxidation, passivation, and surface chemistry.
  • Assessing wettability and surface energy before bonding.

Materials & Industries We Apply It To

Surface analysis is done wherever coatings, films, and surface chemistry govern behavior.

Materials: Thin Films & Coatings · Wafers & Die · Metals & Alloys · Nanomaterials · Biomaterials · Adhesives & Sealants

Industries: Semiconductors · Electronics · Aerospace · Medical Devices · Automotive · Manufacturing

Standards & Test Methods

This Surface analysis is governed by ISO and ASTM methods for calibration, quantification, and depth profiling. Where an applicable standard exists, testing is aligned to it and cited in your report. We align to the method your specification requires and document it.

Analysis / Standard What It Covers
XPS X-Ray Photoelectron Spectroscopy
ToF-SIMS Time-Of-Flight Secondary Ion Mass Spectrometry
High Res XPS High-Resolution X-Ray Photoelectron Spectroscopy
AES Auger Electron Spectroscopy
SIMS Secondary Ion Mass Spectrometry
Ellipsometry Surface Roughness & Topography
Optical Profilometry Surface Roughness & Topography
ASTM F21 Hydrophobic Surface Films Test
ASTM E996 XPS & Auger Electron Spectroscopy Data Reporting & Analysis
ASTM E995 Background Subtraction in Auger & XPS Spectra
ASTM E984 Chemical & Matrix Effect Identification in Auger Electron Spectroscopy
ASTM D7490 Contact Angle Measurements
ASTM B568 Coating Thickness Measurement by XRF
ASTM D6556 Total and External Surface Area by Nitrogen Adsorption
ASTM D6132 Dry Film Thickness using an Ultrasonic Gauge

About MatX Lab

MatX Lab is associated with a network of accredited partner laboratories, so surface chemistry, depth-profiling, and wettability work run under one program. One contact, one report. Methods are aligned to ASTM, ISO, IEC, UL, and MIL-STD where a published method applies. MatX Lab is an analysis provider, not a standards body, and issues no certifications. NDAs are routine.

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